NDLI: A dual-threshold method for photon counting imaging with the EMCCD

Content Provider	IEEE Xplore Digital Library
Author	Beibei Zhou Qian Chen Weiji He Wenwen Zhang
Copyright Year	2010
Description	Author affiliation: Ministerial Key Laboratory of JGMT, Nanjing University of Science and Technology, 210094, China (Beibei Zhou; Qian Chen; Weiji He; Wenwen Zhang)
Abstract	A dual-threshold method is proposed in this paper to reduce the spurious photon events in photon counting imaging with a thermoelectric cooling electron multiplying charge coupled device (EMCCD). Using the thresholds in both spatial and time domains, the read noise, dark signal and clock induced charges (CIC) can be filtered simultaneously. The theory and measurements of the dual-threshold technique are presented. The results show that this method works better than 5σ threshold method in restoring photon images with the EMCCD of the working temperature at −20 °C. The sensitivity of thermoelectric cooling EMCCDs can be effectively improved by the dual-threshold technique. Photon images could be still restored under the illumination level of 0.1e-/pixel/frame.
Starting Page	3333
Ending Page	3336
File Size	590791
Page Count	4
File Format	PDF
ISBN	9781424479924
ISSN	15224880
e-ISBN	9781424479948
e-ISBN	9781424479931
DOI	10.1109/ICIP.2010.5652803
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-09-26
Publisher Place	Hong Kong
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Photonics Pixel Noise Imaging Image restoration Cooling Lighting single photon detection electron multiplying CCD (EMCCD) low light level photon counting imaging photon electron (PE) spurious photon event (SPE)
Content Type	Text
Resource Type	Article

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