NDLI: Outage capacity of opportunistic beamforming with random user locations

Content Provider	IEEE Xplore Digital Library
Author	Samarasinghe, T. Inaltekin, H. Evans, J.S.
Copyright Year	2013
Description	Author affiliation: Dept. of Electr. & Comput. Syst. Eng., Monash Univ., Clayton, VIC, Australia (Samarasinghe, T.; Evans, J.S.) \|\| Dept. of Electr. & Electron. Eng., Antalya Int. Univ., Turkey (Inaltekin, H.)
Abstract	This paper studies the outage capacity of a network consisting of a multitude of heterogenous mobile users, and operating according to the classical opportunistic beamforming framework. The base station is located at the center of the cell, which is modeled as a disk of finite radius. The random user locations are modeled using a homogenous spatial Poisson point process. The received signals are impaired by both fading and location dependent path loss. For this system, we first derive an expression for the beam outage probability. This expression holds for all path loss models that satisfy some mild conditions. Then, we focus on two specific path loss models (i.e., an unbounded model and a more realistic bounded one) to illustrate the applications of our results. In the large system limit where the cell radius tends to infinity, the beam outage capacity and its scaling behavior are derived for the selected specific path loss models. It is shown that the beam outage capacity scales logarithmically for the unbounded model. On the other hand, this scaling behavior becomes double logarithmic for the bounded model. Intuitive explanations are provided as to why we observe different scaling behavior for different path loss models. Numerical evaluations are performed to give further insights, and to illustrate the applicability of the outage capacity results even to a cell having a small finite radius.
Sponsorship	IEEE Commun. Soc.
Starting Page	1944
Ending Page	1949
File Size	508159
Page Count	6
File Format	PDF
ISBN	9781479913534
DOI	10.1109/GLOCOM.2013.6831359
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-12-09
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Signal to noise ratio Interference Numerical models Convergence Fading Vectors
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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