NDLI: A stochastic geometry approach for outage analysis of ad hoc SISO networks in Rayleigh fading

Content Provider	IEEE Xplore Digital Library
Author	Afzal, A. Hassan, S.A.
Copyright Year	2013
Description	Author affiliation: Sch. of Electr. Eng. & Comput. Sci., Nat. Univ. of Sci. & Technol., Islamabad, Pakistan (Afzal, A.; Hassan, S.A.)
Abstract	In this paper, a closed-form expression for the outage probability of an ad hoc single-input single-output (SISO) network is derived when the network is subject to Rayleigh fading and arbitrary path loss model. The underlying stochastic geometry of the network assumes a simple point process in which a single node is placed randomly in a square region. A closed-form expression of the distribution of the distance between a pair of nodes is derived. This expression is then generalized for positive powers to incorporate the path loss exponent. Moment matching is used to make the model analytically tractable. It is shown that the distribution of the distance is well approximated by the Weibull distribution with the scale parameter depending on the size of the network and a constant shape parameter. The coverage and outage behaviors of the network for various network sizes and path loss exponents are quantified. Numerical simulations are performed to validate the theoretical models.
Sponsorship	IEEE Commun. Soc.
Starting Page	336
Ending Page	341
File Size	521894
Page Count	6
File Format	PDF
ISBN	9781479913534
DOI	10.1109/GLOCOM.2013.6831093
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-12-09
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Ad hoc networks Weibull distribution Wireless communication Spread spectrum communication Approximation methods Rayleigh channels outage probability SISO networks
Content Type	Text
Resource Type	Article

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