NDLI: Effect of Oxygen Bombardment on Structural and Magnetic Properties of Ion-beam Deposited NiFe/Fe-oxide Bilayers

Content Provider	IEEE Xplore Digital Library
Author	Lin, K. Ko, P. Liu, C. Guo, Z. Van Lierop, J.
Copyright Year	2006
Description	Author affiliation: Nat. Chung Hsing Univ., Taichung (Lin, K.; Ko, P.; Liu, C.; Guo, Z.)
Abstract	In this paper, the potential for new device materials and insight into the effects of some of the different iron oxide forms on exchange bias with NiFe (Permalloy) was discussed. The iron-oxides have significantly different magnetic properties. Thin film bilayers were deposited using a dual ion-beam deposition technique that produced an antiferromagnetic iron-oxide layer composition that ranged from $Fe_{3}O_{4}$ to $Fe_{2}O_{3}.$ The crystal structures of the Fe-oxide films were characterized by X-ray diffractometry (XRD). A JEOL (JEM-2010) Transmission electron microscope (TEM) operating at 200 kV was used for microstructural analysis. The magnetic properties such as exchange coupling and magnetic hysteresis of these bilayers were characterized using a vibrating sample magnetometer (VSM) and a superconducting quantum interference device (SQUID) magnetometry.
Starting Page	950
Ending Page	950
File Size	709862
Page Count	1
File Format	PDF
ISBN	1424414792
DOI	10.1109/INTMAG.2006.374981
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-05-08
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Intermag Conference
Subject Keyword	Oxygen Magnetic properties Iron Antiferromagnetic materials Superconducting films SQUIDs Magnetic materials Sputtering Crystal microstructure Magnetic films
Content Type	Text
Resource Type	Article

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