NDLI: Probabilistic dual-Vth leakage optimization under variability

Content Provider	IEEE Xplore Digital Library
Author	Davoodi, A. Srivastava, A.
Copyright Year	2005
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Maryland Univ., College Park, MD (Davoodi, A.; Srivastava, A.)
Abstract	In this paper we address the problem of growing leakage variability through effective dual-threshold voltage assignment. We propose a probabilistic dynamic programming-based method to assign dual-threshold voltages such that the overall expected leakage is minimized under a given probability of violating the timing constraint (timing yield). The key characteristics of our strategy are two pruning criteria that stochastically identify pareto-optimal solutions and prune the sub-optimal ones. Compared to other variability-driven dual-threshold voltage assignment schemes, the main advantages of our approach are 1) considering correlations due to common sources of variation, 2) providing controllable runtime, which in one of the proposed strategies is comparable to the deterministic algorithm, and 3) performing optimization based on all the signal paths simultaneously, as opposed to one path at a time. Experimental results indicate that the proposed probabilistic scheme is significantly better than a comparable deterministic dual-threshold voltage assignment, both in terms of expected leakage and the probability of violating the timing constraint
Sponsorship	ACM SIGDA IEEE Circuits and Syst. Soc
Starting Page	143
Ending Page	148
File Size	1408011
Page Count	6
File Format	PDF
ISBN	1595931376
DOI	10.1109/LPE.2005.195504
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-08-08
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Association for Computing Machinery, Inc. (ACM)
Subject Keyword	Timing Threshold voltage Delay Algorithm design and analysis Permission Random variables Educational institutions Voltage control Logic design Design optimization
Content Type	Text
Resource Type	Article

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Probabilistic Dual-Vth Leakage Optimization under Variability (2005)

Leakage power reduction by dual-vth designs under probabilistic analysis of vth variation (2004).

1.1 Leakage Power Reduction by Dual-Vth Designs Under Probabilistic Analysis of Vth Variation

Leakage Power Reduction by Dual-Vth Designs Under Probabilistic Analysis of Vth Variation

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Hybrid design of dual Vth and power gating to reduce leakage power under Vth variations

Statistical optimization of leakage power considering process variations using dual-Vth and sizing

Probabilistic dual-Vth leakage optimization under variability

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Probabilistic dual-Vth leakage optimization under variability

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