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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | D'Arco, M. Liccardo, A. Pasquino, N. |
| Copyright Year | 2011 |
| Description | Author affiliation: Department of Electrical Engineering, University of Naples Federico II via Claudio 21, 80125 Napoli, Italy (D'Arco, M.; Liccardo, A.; Pasquino, N.) |
| Abstract | In order to assess the performance of digital to analog converters (DAC) the attention is generally focused on the integral nonlinearity (INL). Useful diagnostic tools to detect the causes of poor linearity are the linearity and intermodulation errors, which can be evaluated from INL measurements. Linearity and intermodulation errors highlight and quantify erroneous calibration and unwanted interactions between current sources inside the DAC hardware. Unfortunately, their estimates, especially those related to high order intermodulation errors are characterized by high uncertainty. It is thus difficult assessing their relevance on the base of their very uncertain value. It is shown that by means of the analysis of variance (ANOVA) the relevance of intermodulation errors can be assessed from a limited set of INL measurements. ANOVA is in fact capable of distinguishing if the variance in INL measurements has to be addressed to active factors or noise, even if the effect of each factor is widespread upon different elements of the INL array and in different combinations with the other factors. |
| Starting Page | 1 |
| Ending Page | 5 |
| File Size | 278299 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781424479337 |
| ISSN | 10915281 |
| e-ISBN | 9781424479351 |
| DOI | 10.1109/IMTC.2011.5944196 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-05-10 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Analysis of variance Linearity Matrix converters Noise Voltage measurement Uncertainty Software contrasts integral nonlinearity linearity errors intermodulation errors test matrix |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Electrical and Electronic Engineering |
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