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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chia-Yen Chan Po-Han Huang Yu-Cheng Cheng Shenq-Tsong Chang Ting-Ming Huang Chien-Liang Lin |
| Copyright Year | 2011 |
| Description | Author affiliation: Instrument Technology Research Center, National Applied Research Laboratories, Hsinchu, Taiwan, R.O.C. (Chia-Yen Chan; Po-Han Huang; Yu-Cheng Cheng; Shenq-Tsong Chang; Ting-Ming Huang; Chien-Liang Lin) |
| Abstract | A novel nondestructive method of measuring the refractive indices and thicknesses of transparent lenses has been developed. Experimental measurements and numerical computations have been complementarily adopted in the paper. Experimentally, five selected lens samples will be used to quantitatively measure the radii of curvature and the best focusing positions on the both surfaces of the lenses. Subsequently, the refractive indices and thicknesses of the lens samples will be obtained through a derived numerical methodology. Such a measurement method of the refractive index and thickness of a lens has not been reported in the past. The results of the measured refractive index and thickness will be identified and compared with the nominal results. The uncertainties for both the refractive index and thickness of the lens will be deduced as well. |
| Starting Page | 1 |
| Ending Page | 3 |
| File Size | 198047 |
| Page Count | 3 |
| File Format | |
| ISBN | 9781424479337 |
| ISSN | 10915281 |
| e-ISBN | 9781424479351 |
| DOI | 10.1109/IMTC.2011.5944116 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-05-10 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Lenses Thickness measurement Refractive index Focusing Optical variables control Optical refraction Measurement uncertainty uncertainty radius of curvature refractive index central thickness |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Electrical and Electronic Engineering |
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