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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Bronckers, S. Vandersteen, G. Soens, C. Van der Plas, G. Rolain, Y. |
| Copyright Year | 2007 |
| Description | Author affiliation: IMEC, Leuven (Bronckers, S.; Vandersteen, G.; Soens, C.; Van der Plas, G.) |
| Abstract | On-chip oscillators are very sensitive to substrate perturbations. Both low-frequency and high-frequency distortions can ruin the required spectral purity of the oscillator. This paper presents the measurement and modeling results of the sensitivity of a 900 MHz LC-voltage controlled oscillator (LC-VCO) to substrate perturbations in a frequency range from DC to 900 MHz. Accurate measurement of the sensitivity require various measurement setups to investigate different impact phenomena. These measurements implies spectral analysis, linear vectorial network analyzer measurements and time domain measurements. The impact of substrate noise is modeled in a high Ohmic 0.18 mum 1P6M CMOS technology. Below 10MHz, the impact is dominated by the on-chip resistance of the VCO ground. Above 10MHz, the bond wires, parasitics of the on-chip inductor and the off-chip decoupling capacitors determine the sensitivity to substrate perturbations. |
| Starting Page | 1 |
| Ending Page | 6 |
| File Size | 1480185 |
| Page Count | 6 |
| File Format | |
| ISBN | 1424405882 |
| ISSN | 10915281 |
| DOI | 10.1109/IMTC.2007.379389 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-05-01 |
| Publisher Place | Poland |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Noise measurement Distortion measurement Electrical resistance measurement Oscillators Time measurement CMOS technology Low-frequency noise Frequency measurement Spectral analysis Time domain analysis immunity Substrate noise CMOS integrated circuit voltage controlled oscillator sensitivity |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Electrical and Electronic Engineering |
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