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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Schat, J. |
| Copyright Year | 2007 |
| Description | Author affiliation: NXP Semicond., Hamburg (Schat, J.) |
| Abstract | Measuring the sensitivity of a system (e.g. a sensor) is usually done by sequentially applying different input levels and measuring the difference of the output levels. Repeating this procedure several times significantly reduces the effect of slow fluctuations; however these can be removed completely by choosing an optimal sequence of input stimuli. We used the binary thue-morse sequence as a stimulating sequence, and compared the results with those of the standard alternating sequence. We considered perturbations modeled as noise and exponential decay functions. Immunity to perturbations increased dramatically, especially for the exponential decay function, merely by reordering the stimulation sequence. |
| Starting Page | 1 |
| Ending Page | 6 |
| File Size | 1771843 |
| Page Count | 6 |
| File Format | |
| ISBN | 1424405882 |
| ISSN | 10915281 |
| DOI | 10.1109/IMTC.2007.379015 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-05-01 |
| Publisher Place | Poland |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Fluctuations Metrology Time measurement Sensor systems Semiconductor device noise Instrumentation and measurement Noise cancellation Binary sequences Optoelectronic devices Additives Sensors Drift Noise Thue-Morse-Sequence |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Electrical and Electronic Engineering |
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