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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | de la Rosa, J.-J.G. Mufioz, A.M. Luque, A. |
| Copyright Year | 2007 |
| Description | Author affiliation: Cadiz Univ., Cadiz (de la Rosa, J.-J.G.) |
| Abstract | This paper deals with power-quality (PQ) event characterization using higher-order cumulants. Their maxima and minima are the main features, and classification is based in competitive layers. We concentrate on differentiating two types of transients (short duration and long duration). By measuring the fourth-order cumulants' maxima and minima, we build the two-dimensional feature measured vector. Cumulants are calculated over high-pass filtered signals, to avoid the 50-Hz signal. We have observed that the minima and maxima produce clusters in the feature space for 4th-order cumulants; third-order cumulants are not capable of differentiate these two very similar PQs. The experience sets the foundations of an automatic procedure. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 277121 |
| Page Count | 4 |
| File Format | |
| ISBN | 1424405882 |
| ISSN | 10915281 |
| DOI | 10.1109/IMTC.2007.379017 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-05-01 |
| Publisher Place | Poland |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Neural networks Voltage Transient analysis Industrial electronics Power quality Electronic mail Higher order statistics Signal processing Instrumentation and measurement Instruments Transient detection Competitive layers Cumulants Higher-Order statistics |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Electrical and Electronic Engineering |
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