NDLI: Force calibration of a dual-probe nanotweezer using a mechanical lever

Content Provider	IEEE Xplore Digital Library
Author	Hui Xie Weibin Rong Aiwen Wu Chen Yang Lining Sun
Copyright Year	2012
Description	Author affiliation: The State Key Laboratory of Robotics and Systems, Harbin Institute of Technology, 150001 Harbin, P. R. China (Hui Xie; Weibin Rong; Aiwen Wu; Chen Yang; Lining Sun)
Abstract	This paper presents a noncontact force calibration method in applications of the dual-probe nanotweezer. A 2 DOF mechanical lever has been developed to directly calibrate both the normal and lateral sensitivities of two optical levers used to independently measure normal and lateral forces applied on the nanotweezer. The mechanical lever is designed with a configuration of two mutually perpendicular levers, each consists of two flexible hinges, sharing a same rotational center, Each lever can convert the translation into a nanoscale rotation angle that provides an accurate conversion between the photodiode voltage output and deflective angle of a cantilever. During the calibration, a cantilever is mounted on the mechanical lever and attached on the rotational center of the flexible hinges. By making use of its nanomotion on the Z-axis and using an external motion on the barrier, this device can complete the local and full-range sensitivity calibrations of the optical levers without modifying the actual AFM or the cantilevers. Nonlinearities on both normal and lateral of the optical levers have been accurately compensated.
Starting Page	134
Ending Page	139
File Size	1071428
Page Count	6
File Format	PDF
ISBN	9781467345880
e-ISBN	9781467345903
e-ISBN	9781467345897
DOI	10.1109/3M-NANO.2012.6472971
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-08-29
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Sensitivity Mechanical lever Noncontact force calibration Force Optical variables measurement Calibration Photodiodes Optical sensors Probes Nonlinearity compensation Dual-probe nanotweezer
Content Type	Text
Resource Type	Article

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