NDLI: New Epstein Frame for Core Loss Measurements at High Frequencies and High Flux Densities

Content Provider	IEEE Xplore Digital Library
Author	Manyage, M.J. Pillay, P.
Copyright Year	2008
Description	Author affiliation: Dept. of Electr. Eng., Univ. of Cape Town, Cape Town (Manyage, M.J.)
Abstract	This paper presents a new Epstein frame capable of core loss measurements on laminations subjected to high frequencies and high flux densities. The lamination characterization at high frequencies and high flux densities is mandatory in loss calculation procedure for high speed novel designs. The new 200- turn frame is compared with the 352-turn industrial standard frame and the recently developed 280-turn frame. The 200-turn frame core loss results show the ability of the frame to reach higher flux densities than the other two frames. The 280-turn frame core loss results have also been extended from 1 kHz to 6 kHz.
Starting Page	1
Ending Page	6
File Size	353530
Page Count	6
File Format	PDF
ISBN	9781424422784
ISSN	01972618
DOI	10.1109/08IAS.2008.51
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-05
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Materials testing Density measurement Lamination Core loss Cities and towns Magnetic hysteresis Loss measurement Magnetic materials Frequency measurement Manufacturing
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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