NDLI: Low frequency noise in organic solar cells

Content Provider	IEEE Xplore Digital Library
Author	Katsu, H. Kawasugi, Y. Yamada, R. Tada, H.
Copyright Year	2011
Description	Author affiliation: Division of Materials Physics, Graduate School of Engineering Science, Osaka University, Toyonaka 560-8531, Japan (Katsu, H.; Kawasugi, Y.; Yamada, R.; Tada, H.)
Abstract	The conduction mechanism in organic heterojunction solar cells (OHSCs) has been discussed based on the results of low frequency noise spectroscopy. We prepared OHSCs composed of poly-(2-methoxy-5-(3′,7′-dimethyloctyloxy)-1,4-phenylenevinylene), regioregular poly(3-hexylthiophene) and [6,6]-phenyl-C61-butyric acid methyl ester. The devices prepared exhibited 1/ƒ noise at the bias voltage range from +2 V (forward) to −2 V (reverse). It was found that there were three regimes in the noise spectral density Si(ƒ) in the forward bias voltage region. In the ohmic regime, Si(ƒ) increased in proportional to the square of current. In the trap filling regime, Si(ƒ) was constant, while it increased again in the space charge limited current regime. In addition to this behavior, the noise spectra of OHSCs in the reverse bias voltage region exhibited the superposition of 1/ƒ noise and the generation-recombination noise indicating the existence of carrier trap sites. These phenomena observed were thought to result from the breakdown and/or alleviation of the conduction path, which was caused by thermal stress of current flow.
Starting Page	77
Ending Page	79
File Size	714900
Page Count	3
File Format	PDF
ISBN	9781457701894
e-ISBN	9781457701924
DOI	10.1109/ICNF.2011.5994389
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-06-12
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Semiconductor device measurement Fluctuations Voltage measurement Photovoltaic cells Low frequency noise Organic solar cell Power spectral density Variable range hopping conduction 1/ƒ noise Low-frequency noise Noise measurement
Content Type	Text
Resource Type	Article

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