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Content Provider | IEEE Xplore Digital Library |
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Author | Malik, J. Sainarayanan, G. Dahiya, R. |
Copyright Year | 2010 |
Description | Author affiliation: Department of Electrical Engineering, National Institute of Technology, Kurukshetra, India (Malik, J.; Dahiya, R.) || ICT Academy of Tamil Nadu, Chennai, India (Sainarayanan, G.) |
Abstract | Palmprint recognition is an effective biometric authentication method to automatically identify a person's identity. In this paper, phase congruency method is proposed to extract features from a palm-print image for authentication. The phase congruency is one of the promising methods to analyse the image as it is invariant to image contrast and therefore can extract reliable features under varying illumination conditions. In addition, a Min Max Threshold Range (MMTR) method is proposed that helps in increasing overall system accuracy by matching a person with multiple threshold values. In this technique, firstly the person is authenticated at global level using Reference threshold. Secondly, the person is authenticated at local level using range of Minimum and Maximum thresholds defined for a person. Generally, personal authentication is done using reference threshold but there are chances of false acceptance. So, by using the Minimum and Maximum Thresholds range of false accepted persons at personal level, a person is identified to be false accepted or genuinely accepted. MMTR is an effective technique to increase the accuracy of the palmprint authentication system by reducing the False Acceptance Rate (FAR). Hamming Distance similarity measurement method and Sliding Window approach is used to compare the similarity/dissimilarity between two feature vectors. |
Starting Page | 388 |
Ending Page | 393 |
File Size | 313477 |
Page Count | 6 |
File Format | |
ISBN | 9781424485956 |
e-ISBN | 9781424485949 |
DOI | 10.1109/ICSIP.2010.5697504 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2010-12-15 |
Publisher Place | India |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Accuracy Hamming distance Databases Palmprint recognition Image edge detection Authentication Hamming Distance Phase Congruency Sliding Window Feature extraction Arrays |
Content Type | Text |
Resource Type | Article |
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