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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Zheng Yuan Wu Jia-Yu Tsai Shiang-Feng Tang Tzu-Chiang Chen Wen-Jen Lin Ping-Kuo Weng Picard, F. Oulachgar, H. Pope, T. Ilias, S. |
| Copyright Year | 2014 |
| Description | Author affiliation: Inst. Nat. d'Opt. (INO), QC, Canada (Picard, F.; Oulachgar, H.; Pope, T.; Ilias, S.) || Dept. of Electr. & Electron. Eng., Nat. Defense Univ., Taoyuan, Taiwan (Zheng Yuan Wu; Jia-Yu Tsai; Tzu-Chiang Chen) || Mater. & Electro-Opt. Res. Div., Nat. Chung Shun Inst. of Technol., Taoyuan, Taiwan (Shiang-Feng Tang; Wen-Jen Lin; Ping-Kuo Weng) |
| Abstract | In this paper, figures of merit describing the performances of infrared (IR) bolometer sensor such as thermal response time (τ), responsivity, detectivity (D*), noise equivalent power (NEP) and noise equivalent temperature difference (NETD) are estimated using numerical simulations. The proposed model is based on the analytical formulas from Frank Niklaus, et.al. Using this model, we have evaluated the performance of two-legged, uncooled infrared bolometer sensor with 52×52 $μm^{2}$ and 35×35 $μm^{2}$ pixel-pitch size. The bolometer sensors were fabricated by Institut National d'Optique (INO), Canada and National Chung-Shan Institute Science of Technology (NCSIST), Taiwan. Test structures including uncooled vanadium oxide bolometer FPAs were fabricated at INO to verify the agreement between the simulated and experimental data. The performance model was used at NCSIST to evaluate the improvements on design and fabrication of bolometer FPAs with pixel pitch varying form 35 μm to 52 μm. |
| Starting Page | 115 |
| Ending Page | 118 |
| File Size | 301592 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781467367523 |
| DOI | 10.1109/ISOT.2014.35 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-11-05 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Resistance Temperature sensors Noise equivalent temperature difference (NETD) Responsivity (R) Detectivity (D) Analytical models Thermal response time (t) Noise equivalent power (NEP) Noise Imaging Bolometers Time factors |
| Content Type | Text |
| Resource Type | Article |
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