NDLI: A CAD coupled laser beam test system for digital circuit failure analysis

Content Provider	IEEE Xplore Digital Library
Author	Fritz, J. Lackmann, R.
Copyright Year	1989
Description	Author affiliation: Fraunhofer Inst. of Microelectron. Circuits & Syst., Duisburg, West Germany (Fritz, J.; Lackmann, R.)
Abstract	A nondestructive automated digital test system is described. It consists of a laser scanning microscope (LSM) coupled to a CAD (computer-aided design) layout database. Logic state detection and automated failure analysis in CMOS circuits can be done without the need of vacuum and with a minimum of circuit environment preparation. The coupling of the LSM and the CAD layout database leads to automated node location and shortens the failure search because it enables the user to backtrace signal interconnections inside the circuit during the local test session. The system's performance is explained by considering a typical application example, an operational amplifier in mixed bipolar/CMOS technology.<>
Starting Page	332
Ending Page	335
File Size	332402
Page Count	4
File Format	PDF
DOI	10.1109/EMTS.1989.69000
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1989-09-25
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Coupling circuits Optical coupling Laser beams System testing Digital circuits Design automation CMOS logic circuits Automatic testing Databases
Content Type	Text
Resource Type	Article

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A CAD coupled laser beam test system for digital circuit failure analysis