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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hirata, M. Takahashi, T. Schibuya, N. |
| Copyright Year | 2007 |
| Description | Author affiliation: Fuji Xerox, Ebina (Hirata, M.) |
| Abstract | This paper describes the results of the round robin test for IEC 61000-4-2 ESD immunity test which was held in Japan. In order to reduce the variation of the test results of the ESD test depending on the ESD generator, the additional restriction for ESD current waveform was proposed and considered in IEC SC77B/MT12. The effect of the restriction was evaluated by round robin test at three countries; Japan, U.S.A and Germany. The test results show that the restriction is effective to reduce the variation, however, the much severe restriction is needed to reduce the dependency of the ESD generator. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 427075 |
| Page Count | 4 |
| File Format | |
| ISBN | 1424413494 |
| DOI | 10.1109/ISEMC.2007.171 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-07-09 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electrostatic discharge IEC standards Round robin Testing Grounding Delay effects Performance evaluation Virtual manufacturing AC generators Printers |
| Content Type | Text |
| Resource Type | Article |
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