NDLI: Improvements of time-domain transmission waveform and eye diagram of serpentine delay line using guard trace stubs in stripline structure

Content Provider	IEEE Xplore Digital Library
Author	Guang-Hwa Shiue Jia-Hung Shiu Po-Wei Chiu Zhi-Hao Zhang Man-Ni Yeh Wei-Cheng Ku
Copyright Year	2010
Description	Author affiliation: Advanced Packaging and EMC Lab (APEMC Lab), Department of Electronic Engineering, Chung Yuan Christian University, Taoyuan, Taiwan, R. O. C. (Guang-Hwa Shiue; Jia-Hung Shiu; Po-Wei Chiu; Zhi-Hao Zhang; Man-Ni Yeh) \|\| Development Dept. / R&D Division, MPI Corporation, Chu-Pei City, Hsinchu County 302, Taiwan, R.O.C. (Wei-Cheng Ku)
Abstract	The utilization of guard traces with two ground vias at both ends to improve the eye opening and jitter for serpentine delay lines has been investigated. However, it is not easy to accomplish using normal manufacturing technology nowadays because the position of the pad of grounded via is surrounded by serpentine trace. This is especially true in normal manufacturing technology, in which size of the via pad is larger. Therefore, this study proposes crosstalk noise reduction of the time-domain transmission (TDT) waveform and eye diagram of the serpentine delay line by guard trace stubs, i.e. the guard trace of one end is grounded via and the other is open-end, with stripline structure. The crosstalk reduced efficiency for using guard trace stubs is the same as when using guard traces on the time domain of the serpentine delay line. This is because, the open-end leads to the noise cancellation mechanism of the guard trace stub. Based on HSPICE simulation, it demonstrates that the utilization of the guard trace stubs can reduce the original TDT crosstalk level by more than 50%, thereby greatly improving the eye opening and jitter. Finally, this study also performs time-domain measurement to validate the proposed analyses.
Starting Page	249
Ending Page	252
File Size	11723106
Page Count	4
File Format	PDF
ISBN	9781424468652
e-ISBN	9781424468676
e-ISBN	9781424468669
DOI	10.1109/EPEPS.2010.5642597
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-10-25
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Delay lines Crosstalk Bit error rate Signal analysis Time domain analysis Stripline Jitter time-domain transmission (TDT) Signal integrity(SI) serpentine delay line guard trace guard trace stub eye diagram
Content Type	Text
Resource Type	Article

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