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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Greig, K.S. Chodavarapu, V.P. |
| Copyright Year | 2014 |
| Abstract | An 8-bit 20k samples-per-second digital-to-analog converter (DAC) capable of operating within the extreme wide-temperature range was developed in a 130nm bulk CMOS technology. Emphasis was placed on the design of a temperature insensitive operational amplifier (op-amp) used in DAC. A novel approach for common mode-feedback with a nested miller compensation op-amp was used in combination with other established methods to mitigate the negative effects of high temperatures on bulk CMOS devices. At 225 °C, the op-amp had a power consumption of 647 μW, with a DC gain of 76 dB, a unity gain bandwidth of 56.8 MHz and a phase margin of 100 degrees. The functionality of the 8-bit DAC was characterized at all operating corners over the extreme wide-temperature range. |
| Starting Page | 1 |
| Ending Page | 5 |
| File Size | 1131477 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781479930999 |
| ISSN | 08407789 |
| e-ISBN | 9781479931019 |
| DOI | 10.1109/CCECE.2014.6901016 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-05-04 |
| Publisher Place | Canada |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Temperature distribution Gain Temperature sensors Resistors Digital-analog conversion Power demand Data models |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering Hardware and Architecture |
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