NDLI: Temperature distributions in III-V microwave power transistors using spatially resolved photoluminescence mapping

Content Provider	IEEE Xplore Digital Library
Author	Landesman, J.P. Floriot, D. Martin, E. Bisaro, R. Delage, S.L. Braun, P.
Copyright Year	2000
Description	Author affiliation: Lab. Central de Recherches, Thomson-CSF, Orsay, France (Landesman, J.P.)
Abstract	This paper describes a new method for the mapping of local temperatures in the active region of high power III-V semiconductor transistors for microwave applications. The measurement technique involves scanning a focused laser beam at the surface of a chip inside its package, while the photoluminescence (PL) spectra produced are recorded sequentially for each position of the laser beam. The local temperature is deduced from the corresponding wavelength shift of the PL peak, which represents changes in the band-gap due to heating. Results are shown both for field effect type transistors (pseudomorphic high electron mobility transistors-PHEMTs-in the GaAs/Ga/sub 1-x/Al/sub x/As/Ga/sub 1-y/In/sub y/As system) and for bipolar type transistors (heterojunction bipolar transistors-HBTs-in the GaAs/Ga/sub 1-x/In/sub x/P system). A spatial resolution of 1 /spl mu/m and an accuracy in the temperature determination of /spl plusmn/1/spl deg/C are demonstrated, especially for the PHEMTs. Finally, procedures are proposed to implement the information on local operating temperatures provided by this method into thermal resistance calculations.
File Size	779218
File Format	PDF
ISBN	0780357663
DOI	10.1109/ICCDCS.2000.869853
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-03-17
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature distribution III-V semiconductor materials Power transistors Electromagnetic heating Semiconductor lasers Masers Laser beams Heterojunction bipolar transistors FETs HEMTs
Content Type	Text
Resource Type	Article

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