NDLI: Intermittent scan chain fault diagnosis based on signal probability analysis

Content Provider	IEEE Xplore Digital Library
Author	Yu Huang Wu-Tung Cheng Cheng-Ju Hsieh Huan-Yung Tseng Alou Huang Yu-Ting Hung
Copyright Year	2004
Description	Author affiliation: Mentor Graphics Corp., Wilsonville, OR, USA (Yu Huang; Wu-Tung Cheng)
Abstract	A new algorithm to diagnose intermittent scan chain fault in scan-based designs is proposed in this paper. An intermittent scan chain fault sometimes is triggered and sometimes is not triggered during scan chain shifting, which makes it very difficult to locate the fault sites. In this paper, we provide answers to three questions: (1) Why intermittent scan chain faults happen? (2) Why diagnosis of this type of faults is necessary? (3) How to diagnose this type of faults? The experimental results presented demonstrate that the proposed diagnosis algorithm is effective for large industrial designs with multiple intermittent scan chain faults.
Sponsorship	EDAA, EDA Consortium, IEEE Comput. Soc. TTTC IEEE Comput. Soc. DATC ECSI ACM/SIGDA RAS
Starting Page	1072
Ending Page	1077
File Size	390694
Page Count	6
File Format	PDF
ISBN	0769520855
ISSN	15301591
DOI	10.1109/DATE.2004.1269035
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-02-16
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault diagnosis Signal analysis Circuit faults Algorithm design and analysis Very large scale integration Circuit testing Graphics Design for testability Silicon Mass production
Content Type	Text
Resource Type	Article

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