NDLI: Critical comparison among some analog fault diagnosis procedures based on symbolic techniques

Content Provider	IEEE Xplore Digital Library
Author	Luchetta, A. Manetti, S. Piccirilli, M.C.
Copyright Year	2002
Description	Author affiliation: Dept. of Electron. & Telecommun., Univ. of Florence, Firenze, Italy (Luchetta, A.)
Abstract	Summary form only given. The parametric fault diagnosis techniques play an important part in the field of analog fault diagnosis. These techniques, starting from a series of measurements carried out on a previously selected test point set, given the circuit topology and the nominal values of the components, are aimed at determining the effective values of the circuit parameters by solving a set of equations nonlinear with respect to the component values. Here the role of symbolic techniques in the automation of parametric fault diagnosis of analog circuits is investigated. Three different methodologies were used by authors during last few years, based on Newton-Raphson type algorithms, neural networks and genetic algorithms, and a comparison has been made. In all the three cases the quite realistic hypothesis of bounded number of faulty components (k-fault hypothesis) is made, taking into account component tolerances. The results of the comparison are summarized.
Sponsorship	EDAA
File Size	185157
File Format	PDF
ISBN	0769514715
ISSN	15301591
DOI	10.1109/DATE.2002.998461
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-03-04
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault diagnosis Circuit testing Fault location Analog circuits Circuit faults Neural networks Automation Optimization methods Genetic algorithms Frequency domain analysis
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

A Method for the Automatic Selection of Test Frequencies in Analog Fault Diagnosis

Symbolic techniques in neural network based fault diagnosis of analog circuits

Critical Comparison among Some Analog Fault Diagnosis Procedures Based on Symbolic Techniques

Optimization of Frequency Testing Stimulus Based on Improved Genetic Algorithm

Fault Diagnosis Approach of Analog Circuits Based on Genetic Wavelet Neural Network

A Novel Method for Analog Fault Diagnosis Based on Neural Networks and Genetic Algorithms

Optimization of LM-BP neural network algorithm for analog circuit fault diagnosis

A fault identification approach for analog circuits using fuzzy neural network mixed with genetic algorithms

Analog circuit fault diagnosis based on neural network and fuzzy logic

Critical comparison among some analog fault diagnosis procedures based on symbolic techniques

Similar Documents

A Method for the Automatic Selection of Test Frequencies in Analog Fault Diagnosis

Symbolic techniques in neural network based fault diagnosis of analog circuits

Critical Comparison among Some Analog Fault Diagnosis Procedures Based on Symbolic Techniques

Optimization of Frequency Testing Stimulus Based on Improved Genetic Algorithm

Fault Diagnosis Approach of Analog Circuits Based on Genetic Wavelet Neural Network

A Novel Method for Analog Fault Diagnosis Based on Neural Networks and Genetic Algorithms

Optimization of LM-BP neural network algorithm for analog circuit fault diagnosis

A fault identification approach for analog circuits using fuzzy neural network mixed with genetic algorithms

Analog circuit fault diagnosis based on neural network and fuzzy logic

Critical comparison among some analog fault diagnosis procedures based on symbolic techniques