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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Sheehan, B.N. |
| Copyright Year | 2002 |
| Description | Author affiliation: Mentor Graphics Corp., Wilsonville, OR, USA (Sheehan, B.N.) |
| Abstract | Accurate gate-level static timing analysis in the presence of RC loads has become an important problem for modern deep-submicron designs. Non-capacitive loads are usually analyzed using the concept of an effective capacitance, C/sub eff/. Most published algorithms for C/sub eff/, however, require special cell characterization or supplemental information that is not part of standard timing libraries. In this paper we present a novel C/sub eff/ algorithm that is strictly compatible with existing timing libraries. It is also fast, easily implemented, and quite accurate-within 3% of transistor-level simulation in our tests. The method is based on approximating a gate by a current source, estimating the delay difference when the gate drives the actual RC load and a reference capacitor, and then converting the delay discrepancy into a C/sub eff/ value. Central to carrying out this program is the innovative concept of delay correction transfer function. |
| Sponsorship | EDAA |
| Starting Page | 826 |
| Ending Page | 830 |
| File Size | 283201 |
| Page Count | 5 |
| File Format | |
| ISBN | 0769514715 |
| ISSN | 15301591 |
| DOI | 10.1109/DATE.2002.998394 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2002-03-04 |
| Publisher Place | France |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Libraries Timing Capacitance Delay estimation Delay effects Iterative algorithms Graphics Standards publication Testing Drives |
| Content Type | Text |
| Resource Type | Article |
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