NDLI: An integrated ECC and redundancy repair scheme for memory reliability enhancement

Content Provider	IEEE Xplore Digital Library
Author	Chin-Lung Su Yi-Ting Yeh Cheng-Wen Wu
Copyright Year	2005
Description	Author affiliation: Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan (Chin-Lung Su; Yi-Ting Yeh; Cheng-Wen Wu)
Abstract	With the fast development pace of deep submicron technology, the size and density of semiconductor memory grows rapidly. However, keeping a high level of yield and reliability for memory products is more and more difficult. Both the redundancy repair and ECC techniques have been widely used for enhancing the yield and reliability of memory chips. Specifically, the redundancy repair and ECC techniques are conventionally used to repair or correct the hard faults and soft errors, respectively. In this paper, we propose an integrated ECC and redundancy repair scheme for memory reliability enhancement. Our approach can identify the hard faults and soft errors during the memory normal operation mode, and repair the hard faults during the memory idle time as long as there are unused redundant elements. We also develop a method for evaluating the memory reliability. Experimental results show that the proposed approach is effective, e.g., the MTTF of a 32K /spl times/ 64 memory is improved by 1.412 hours (7.1%) with our integrated ECC and repair scheme.
Sponsorship	IEEE Comput. Soc. Test Technol. Tech. Council IEEE Comput. Soc. Tech. Comm. on Fault-Tolerant Comput
Starting Page	81
Ending Page	89
File Size	318844
Page Count	9
File Format	PDF
ISBN	0769524648
ISSN	15505774
DOI	10.1109/DFTVS.2005.18
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-10-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Error correction codes Redundancy Circuit faults Fault detection Semiconductor device reliability Semiconductor memory Error correction Built-in self-test Costs Fault tolerance
Content Type	Text
Resource Type	Article

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