NDLI: A monolithic spectral BIST technique for control or test of analog or mixed-signal circuits

Content Provider	IEEE Xplore Digital Library
Author	Emmert, J.M. Cheatham, J.A. Jagannathan, Badhri Umarani, Sandeep
Copyright Year	2003
Description	Author affiliation: Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA (Emmert, J.M.; Cheatham, J.A.; Badhri Jagannathan; Sandeep Umarani)
Abstract	Intelligent radio frequency (RF) front ends make use of MMIC and MEMS devices to provide a limited range of programmability to what have historically been fixed resistive, capacitive, and inductive impedance matching networks. Many BIST methods for mixed-signal systems can also be used to monitor and provide feedback for the control of such RF systems. For example, spectral techniques can be used to analyze and determine the center frequency of a bandpass filter. Information relative to the center frequency can then be fed back into the system, and adjustments can be made to fine tune the filter. In this paper, we outline our spectral based, mixed-signal approach for monitoring the health of analog and RF components in mixed-signal systems on-chip. In our approach we use well known DSP techniques based an the FFT for on-chip signal generation and analysis. We reduce required hardware by using the same functional block to analyze analog output signals that we use to generate m tone stimulus signals. By providing an on-chip functional test capability, we also reduce the test time required on expensive ATE. Our techniques have been prototyped and demonstrated on a Xilinx Virtex-II FPGA using an off-chip ADC and DAC, and we are currently implementing the technique on an ASIC using a 0.13 /spl mu/m process with target execution speeds of 2-16 GHz.
Sponsorship	IEEE Comput. Soc. Test Technol. Tech. Council IEEE Comput. Soc. Tech. Committee on Fault-Tolerant Comput
Starting Page	303
Ending Page	310
File Size	402920
Page Count	8
File Format	PDF
ISBN	0769520421
ISSN	15505774
DOI	10.1109/DFTVS.2003.1250125
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-11-05
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Built-in self-test Radio frequency Monitoring Band pass filters Signal generators Signal analysis Intelligent networks MMICs Microelectromechanical devices
Content Type	Text
Resource Type	Article

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