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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Verdel, T. Makris, Y. |
| Copyright Year | 2002 |
| Description | Author affiliation: Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA (Verdel, T.; Makris, Y.) |
| Abstract | Concurrent error detection (CED) methods are typically employed to provide an indication of the operational health of synchronous circuits during normal functionality. Existing CED techniques, however, require modification in order to be successfully adapted to asynchronous designs. We discuss the limitations of duplication, the simplest CED method, when applied to asynchronous circuits. We demonstrate that such limitations arise mainly due to comparison synchronization issues and inadequate detection of performance-related errors. We propose a circuit that alleviates the difficulties associated with comparison synchronization and we introduce a methodology that enables detection of errors that do not result in logic discrepancies and, thus, may not be detected through comparison. The proposed techniques are illustrated on example circuits, revealing their ability to render concurrently testable asynchronous designs. |
| Starting Page | 345 |
| Ending Page | 353 |
| File Size | 391601 |
| Page Count | 9 |
| File Format | |
| ISBN | 0769518311 |
| ISSN | 15505774 |
| DOI | 10.1109/DFTVS.2002.1173531 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2002-11-06 |
| Publisher Place | Canada |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Asynchronous circuits Circuit testing Circuit faults Synchronization Electrical fault detection Fault detection Clocks Monitoring Design automation Logic circuits |
| Content Type | Text |
| Resource Type | Article |
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