NDLI: A 3-Bit 2.2V 3.08pJ/conversion-step 11GS/s flash ADC in a 0.12μm SiGe BiCMOS technology

Content Provider	IEEE Xplore Digital Library
Author	Yuan Yao Dai, F. Irwin, J.D. Jaeger, R.C.
Copyright Year	2008
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL (Yuan Yao; Dai, F.; Irwin, J.D.; Jaeger, R.C.)
Abstract	A 3-bit ADC for X-band applications that can work at a sampling rate of 11 GS/s is presented in this paper. Current comparators are used to achieve the high sampling rate of 11 GHz at X-band. A 3-bit current-steering DAC is also designed for testing the high-speed ADC. The ADC-DAC RFIC is implemented in a 0.12 mum SiGe technology and occupies a core area of 1.0 x 0.8 $mm^{2}.$ The ADC can operate with a FOM of 3.08 pJ/conversion-step, consuming 0.22 W power with a 2.2 V power supply. It demonstrates a good performance at X-band sampling rate with the lowest power supply voltage, lowest power consumption, smallest core area and best FOM reported so far. The ADC-DAC RFIC is tested in a 44-pin CLLC package and achieves a peak SFDR of 28 dBc and a peak ENOB of 2.7 bits at 11 GS/s sampling rate.
Starting Page	256
Ending Page	259
File Size	441707
Page Count	4
File Format	PDF
ISBN	9781424427253
ISSN	10889299
DOI	10.1109/BIPOL.2008.4662756
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-13
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Power supplies Power demand Silicon germanium Radiofrequency integrated circuits Decoding Quantization Indium phosphide BiCMOS flash analog-to-digital converter (ADC) digital-to-analog converter (DAC) low power low voltage X-band current comparator SiGe
Content Type	Text
Resource Type	Article

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