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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Kwon, J. Mayerich, D. Choe, Y. McCormick, B.H. |
| Copyright Year | 2008 |
| Description | Author affiliation: Dept. of Comput. Sci., Texas A&M Univ., College Station, TX (Kwon, J.; Mayerich, D.; Choe, Y.; McCormick, B.H.) |
| Abstract | Recent advances in high-throughput microscopy are used to acquire large-scale anatomical information at the microscopic level. One of these methods, known as knife-edge scanning microscopy (KESM), allows large volumes of tissue to be imaged using physical sectioning. This method has been limited, however, by constraints on the field of view of the objective and the need to prevent damage to tissue before it is imaged. In this paper, we describe a simple sectioning algorithm we use to overcome these constraints on tissue size. By maintaining a height field of the tissue surface, we are able to cut lateral sections while minimizing damage to un-imaged tissue. Although lateral sectioning introduces some deformation and tissue damage at the interface of the sections, the damage is minimal and the deformations can be compensated for using affine transformations. |
| Starting Page | 1371 |
| Ending Page | 1374 |
| File Size | 1595153 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424420025 |
| DOI | 10.1109/ISBI.2008.4541260 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-05-14 |
| Publisher Place | France |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Optical microscopy Optical imaging High speed optical techniques Cameras Large-scale systems Electron microscopy Electron optics High-resolution imaging Computer science Tissue damage serial sectioning knife-edge scanning microscopy KESM microscopy |
| Content Type | Text |
| Resource Type | Article |
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