NDLI: Investigating connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz

Content Provider	IEEE Xplore Digital Library
Author	Ridler, N.M. Clarke, R.G.
Copyright Year	2013
Description	Author affiliation: Univ. of Leeds, Leeds, UK (Clarke, R.G.) \|\| Nat. Phys. Lab., Teddington, UK (Ridler, N.M.)
Abstract	This paper describes some investigations into the repeatability of connection of some waveguide devices in the WM-250 (WR-01) waveguide size over the recommended operational bandwidth 750 GHz to 1100 GHz. Three devices are investigated - a flush short-circuit, an offset short-circuit, and a near-matched load. These devices can be used as calibration standards for network analyzers, and so can be found in network analyzer calibration kits. The repeatability of the measured reflection coefficient is assessed using statistical techniques. The repeatability is expressed in terms of the experimental standard deviation in both the real and imaginary components of the complex-valued linear reflection coefficient. Finally, recommendations are given on propagating uncertainty when these devices are considered as calibration standards during a network analyzer calibration and measurement process.
Starting Page	1
Ending Page	13
File Size	2501230
Page Count	13
File Format	PDF
ISBN	9781479929351
DOI	10.1109/ARFTG-2.2013.6737350
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-11-18
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Standards Calibration Flanges Reflection coefficient Measurement uncertainty Frequency measurement Apertures Measurement repeatability Measurement standards VNA calibration Submillimeter-wave measurements
Content Type	Text
Resource Type	Article

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Further investigations into connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz

Evaluating the effect of using precision alignment dowels on connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz

Traceability to national standards for S-parameter measurements in waveguide at 1.1 THz

Performance assessment of VNA calibration schemes for millimeter-wave and submillimeter-wave frequencies, using the 33 GHz–50 GHz band

Repeatability and Mismatch of Waveguide Flanges in the 500–750 GHz Band

Repeatability of waveguide flanges with worst-case tolerances in the 500–750 GHz band

Performance of new design of waveguide flange for measurements at frequencies from 800 GHz to 1.05 THz

Improvement of offset short calibration technique in waveguide VNA measurement at millimeter and sub-millimeter wave frequency

Measurement uncertainty in waveguide VNA calibrated by offset short calibration with oversized waveguide aperture at sub-millimeter wave frequency

Investigating connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz

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Further investigations into connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz

Evaluating the effect of using precision alignment dowels on connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz

Traceability to national standards for S-parameter measurements in waveguide at 1.1 THz

Performance assessment of VNA calibration schemes for millimeter-wave and submillimeter-wave frequencies, using the 33 GHz–50 GHz band

Repeatability and Mismatch of Waveguide Flanges in the 500–750 GHz Band

Repeatability of waveguide flanges with worst-case tolerances in the 500–750 GHz band

Performance of new design of waveguide flange for measurements at frequencies from 800 GHz to 1.05 THz

Improvement of offset short calibration technique in waveguide VNA measurement at millimeter and sub-millimeter wave frequency

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Investigating connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz