NDLI: Measurement system transient and power questions in mm-wave high resolution pulsed S-parameter measurements

Content Provider	IEEE Xplore Digital Library
Author	Martens, J.
Copyright Year	2013
Description	Author affiliation: Anritsu, Morgan Hill, CA, USA (Martens, J.)
Abstract	Mm-wave pulse profile measurements can present challenges in part due to high multiplication factors sometimes needed, the position of stimulus modulation (often part way in a multiplier chain), video poles present in some of the elements and generally more difficult linearity questions. These issues have been explored in the 80-500 GHz range and the behavior between modulation and final multiplication was the most dynamic introducing both easily correctable distortions and single-shot effects that are more challenging to process. Resolution, down to the scale of a few ns, did not seem to be affected when reasonable alignment and isothermal procedures were followed. The stimulus power effects also seemed to be minimal when coupled with sufficiently linear receivers. Example calibrations and measurements have been performed for ~20 dBm W-band and D-band systems and lower power WR-2.2 systems.
Starting Page	1
Ending Page	5
File Size	912148
Page Count	5
File Format	PDF
ISBN	9781479929351
DOI	10.1109/ARFTG-2.2013.6737347
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-11-18
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Calibration Pulse measurements Bandwidth Frequency measurement Frequency modulation Power measurement mm-wave calibration pulsed s-parameters high power
Content Type	Text
Resource Type	Article

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