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Content Provider | IEEE Xplore Digital Library |
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Author | Galatro, L. Akhnoukh, A. Magnee, P. Marchetti, M. Spirito, M. |
Copyright Year | 2013 |
Description | Author affiliation: Electron. Res. Lab./DIMES, Delft Univ. of Technol., Delft, Netherlands (Galatro, L.; Akhnoukh, A.; Spirito, M.) || Anteverta-mw B.V., Delft, Netherlands (Marchetti, M.) || NXP Semicond., Nijmegen, Netherlands (Magnee, P.) |
Abstract | In this paper we present the large signal measurements and model verification of SiGe BiCMOS PA cells in the 60 GHz ISM band. The characterization is performed employing a custom developed mixed signal active load-pull test-bench. The measurement system is based on a WR-15 waveguide implementation providing large signal measurement capabilities in the 50-65 GHz band. In this contribution we detail on the test-bench optimization for higher power levels and the measured system stability. A high performance SiGe BiCMOS technology is used as a test vehicle to demonstrate the capability of the mixed signal active load-pull, to evaluate device technology and to benchmark the large-signal prediction of transistor model in the mm-wave band. |
Starting Page | 1 |
Ending Page | 5 |
File Size | 1006891 |
Page Count | 5 |
File Format | |
ISBN | 9781479929351 |
DOI | 10.1109/ARFTG-2.2013.6737343 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2013-11-18 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Semiconductor device measurement Frequency measurement Power measurement Performance evaluation Gain measurement Standards Load modeling open-loop active load-pull mixed-signal mm-wave characterization large-signal |
Content Type | Text |
Resource Type | Article |
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