NDLI: A General Statistical Equivalent-Circuit-Based De-Embedding Procedure for High-Frequency Measurements

Content Provider	IEEE Xplore Digital Library
Author	Ferndahl, M. Fager, C. Andersson, K. Linner, P. Vickes, H.-O. Zirath, H.
Copyright Year	1963
Abstract	A general equivalent-circuit-based method for the de-embedding of scattering parameters is presented. An equivalent circuit representation is used to model the embedding package. The parameters in the models are estimated with a statistical method using measured data from all de-embedding standards jointly together. Hence, it is possible to assess parameter estimates and their variance and covariance due to measurement uncertainties. A general de-embedding equation, which is valid for any five-port with a defined nodal admittance matrix, is derived and used in the subsequent de-embedding of measured device data. Different equivalent circuit models for the embedding network are then studied, and tradeoffs between model complexity and uncertainty are evaluated. Furthermore, the influence of varying number and combinations of de-embedding standards on the parameter estimates is investigated. The method is verified, using both measured and synthetic data, and compared against previously published work. It is found to be more general while keeping or improving accuracy.
Sponsorship	IEEE Microwave Theory and Techniques Society
Starting Page	2692
Ending Page	2700
Page Count	9
File Size	1599970
File Format	PDF
ISSN	00189480
Volume Number	56
Issue Number	12
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Equivalent circuits Parameter estimation Scattering parameters Packaging Statistical analysis Measurement standards Measurement uncertainty Equations Admittance Covariance matrix semiconductor device modeling CMOS de-embedding high-frequency measurement maximum-likelihood estimation scattering parameters
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electrical and Electronic Engineering Radiation

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