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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chekanov, A. Weng, R. Li, F. DongWon Park Mingjun Yu |
| Copyright Year | 1965 |
| Abstract | Write pole-tip protrusion (PTP) effect on the overwrite performance at high recording data rate is discussed. It is shown that the head thermal expansion during the write process may lead to the degradation of overwrite value at high recording data rate. Overwrite degradation is caused by head-disk interactions when a high-frequency pattern is written. Appropriate selection of the disk lubricant can reduce the effect of the write PTP and increase the write current setting margin. At elevated drive temperatures, excessive PTP can cause head-disk interface failure. A write timing method allowing for the recording head to cool between the write cycles is proposed. A method of head-disk interface testing and a method of mapping the head-disk interactions are further described. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 2591 |
| Ending Page | 2593 |
| Page Count | 3 |
| File Size | 171237 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 40 |
| Issue Number | 4 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2004-07-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Magnetic heads Thermal expansion Disk recording Magnetic recording Acoustic emission Thermal degradation Thermal stresses Transistors Manufacturing Infrared heating |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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