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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Kardelky, S. Gebert, A. Gutfleisch, O. Handstein, A. Wyss, U. Schultz, L. |
| Copyright Year | 1965 |
| Abstract | Investigations of the oxidation behavior of Sm(Co, Fe, Cu, Zr)/sub z/-type high temperature permanent magnets are of particular importance for the assessment of their stability under application conditions in the temperature range up to 500/spl deg/C. Sintered magnets of the Sm/sub 2/Co/sub 17/-type were studied regarding the dependence of surface on the exposure temperature and time in air. For the investigation of the oxide layer growth processes at elevated temperatures, time-dependent mass changes were determined using thermo-gravimetrical analysis. Oxidized magnet surfaces were characterized by means of X-ray diffraction, optical microscopy and scanning electron microscopy (incl. energy dispersive analysis). It was found from time-dependent mass changes that a parabolic growth law controls the oxidation on the Sm/sub 2/Co/sub 17/-type magnet surfaces. An oxide layer thickness of 135 /spl mu/m was measured after 312 h exposure time at a temperature of 500/spl deg/C. The outermost oxidic surface layer is mainly formed by oxidized Fe and Co species. The Sm concentration at the surface is depleted due to vaporization. The oxide layer is separated in Co-rich and Sm-rich regions as well as Cu-rich segregations near microcracks. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 2931 |
| Ending Page | 2933 |
| Page Count | 3 |
| File Size | 150366 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 40 |
| Issue Number | 4 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2004-07-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Corrosion Permanent magnets Optical microscopy Oxidation Iron Temperature distribution Magnetic analysis Magnetic force microscopy Scanning electron microscopy Zirconium |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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