NDLI: Polarization-dependent XAFS studies on the role of Ta in the compositional segregation of Co-Cr-Ta magnetic recording media

Content Provider	IEEE Xplore Digital Library
Author	Kemner, K.M. Harris, V.G. Elam, W.T. Feng, Y.C. Laughlin, D.E. Woicik, J.C.
Copyright Year	1965
Abstract	Extended X-ray absorption fine structure (EXAFS) measurements of Ta in Co-Cr-Ta films were performed using normal glancing incident radiation in order investigate, respectively, the in-plane and out-of-plane local structure and chemistry about the Ta atom sites. The Fourier transformed EXAFS data illustrates the presence of an anisotropy between the in-plane and out-of-plane structures around the Ta atoms, indicating that the Ta atoms are incorporated in a closed-packed structure with the c-axis aligned in the plane of the film. Analysis of the local environments around Ta indicates that the Ta atoms are either randomly distributed throughout the film or have preferentially segregated to the Cr-rich regions. Results indicate that an increase in temperature results in Ta having a broader distribution of first-neighbor distances as well as a slight decrease in the number of surrounding atoms. This is consistent with a local structure model which has vacancies preferentially segregating to the Ta atoms thereby decreasing the diffusion of Cr within the grains.
Sponsorship	IEEE Magnetics Society
Starting Page	2806
Ending Page	2808
Page Count	3
File Size	445775
File Format	PDF
ISSN	00189464
Volume Number	31
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-11-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Polarization Magnetic films Atomic measurements Atomic layer deposition Temperature Magnetic recording Electromagnetic wave absorption Chromium Magnetic properties Laboratories
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Compositional inhomogeneities in Co-Cr-Ta/Cr films for longitudinal magnetic recording

APFIM studies of compositional inhomogeneity in sputtered Co-Cr thin films

Polarization-dependent EXAFS studies of chemical and structural anisotropy in sputter-deposited Co/sub 78/Cr/sub 22/ films

Cr migration in CoNiTa/Cr films by annealing

Magnetic and recording characteristics of Co-Cr-Ta/Cr thin film prepared on Si substrate

Interdiffusion and grain isolation in Co/Cr thin films

Co-Cr-Ta perpendicular magnetic recording media using Pt seed layer

Segregation in sputtered Co-Cr films

Microstructural evolution and thermal stability of thin CoCrTa/Cr films for longitudinal magnetic recording media

Polarization-dependent XAFS studies on the role of Ta in the compositional segregation of Co-Cr-Ta magnetic recording media

Similar Documents

Compositional inhomogeneities in Co-Cr-Ta/Cr films for longitudinal magnetic recording

APFIM studies of compositional inhomogeneity in sputtered Co-Cr thin films

Polarization-dependent EXAFS studies of chemical and structural anisotropy in sputter-deposited Co/sub 78/Cr/sub 22/ films

Cr migration in CoNiTa/Cr films by annealing

Magnetic and recording characteristics of Co-Cr-Ta/Cr thin film prepared on Si substrate

Interdiffusion and grain isolation in Co/Cr thin films

Co-Cr-Ta perpendicular magnetic recording media using Pt seed layer

Segregation in sputtered Co-Cr films

Microstructural evolution and thermal stability of thin CoCrTa/Cr films for longitudinal magnetic recording media

Polarization-dependent XAFS studies on the role of Ta in the compositional segregation of Co-Cr-Ta magnetic recording media