NDLI: Magnetic and electrical properties of NiFe-oxide mixture films

Content Provider	IEEE Xplore Digital Library
Author	Nishioka, K. Mitsuoka, K. Fukui, H. Narishige, S. Fuyama, M.
Copyright Year	1965
Abstract	In order to improve the performance of magnetoresistive heads, higher saturation flux density Bs and higher resistivity /spl rho/ are preferable for Soft Adjacent Layer (SAL). NiFe-oxide (oxide=SiO/sub 2/, Al/sub 2/O/sub 3/, ZrO/sub 2/ and Ta/sub 2/O/sub 5/) mixture films were investigated for SAL. Among these films, the NiFe-ZrO/sub 2/ system is preferable because of its high Bs /spl rho/ and low coercivity. The stability of the NiFe-ZrO/sub 2/ system at 250/spl deg/C was also investigated, which shows that Bs and /spl rho/ change by annealing and the changes increase with ZrO/sub 2/ content. MR devices of 3.2 /spl mu/m width and 2.8 /spl mu/m height were fabricated and transfer curves were measured. The maximum output voltage of the device in which NiFe-12mol% ZrO/sub 2/ was employed was 23% larger than the calculated value for the device in which NiFe-Nb (Bs /spl rho/=60 Tesla /spl mu//spl Omega/cm) was assumed to be employed.
Sponsorship	IEEE Magnetics Society
Starting Page	2633
Ending Page	2635
Page Count	3
File Size	380948
File Format	PDF
ISSN	00189464
Volume Number	31
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-11-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Magnetic properties Magnetic films Magnetic flux Saturation magnetization Magnetoresistance Magnetic heads Conductivity Coercive force Stability Annealing
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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