NDLI: Characteristics of RF-sputtered CoCr films

Content Provider	IEEE Xplore Digital Library
Author	Wielinga, T. Lodder, J. Worst, J.
Copyright Year	1965
Abstract	The magnetization of the CoCr recording medium has been investigated by several methods. First the perpendicular hysteresis loops are analysed in the thickness range from 500 to 20,000 Å. This provided evidence that the magnetization process is typefied by domain wall motion. Second the dependence of the coercivity on the film thickness has been determined. The dependence found can be explained if it is assumed, that the coercivity is caused by domain walls, impeded by the crystallite boundaries. Finally stand-still recording experiments have been performed, which confirm that magnetization takes place by the displacement of domain walls. The switching criterion in the writing process is best met by taking the field averaged over the film thickness.
Sponsorship	IEEE Magnetics Society
Starting Page	1107
Ending Page	1109
Page Count	3
File Size	343213
File Format	PDF
ISSN	00189464
Volume Number	18
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1982-11-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Magnetic films Crystallization Coercive force Anisotropic magnetoresistance Magnetization Magnetic hysteresis Perpendicular magnetic recording Semiconductor films Magnetic properties Magnetic domain walls
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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