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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Wanling Deng Junkai Huang Xiaoyu Ma Liou, J.J. |
| Copyright Year | 1980 |
| Abstract | In this letter, a new compact model for the AlGaN/GaN high-electron mobility transistors developed based on explicit solutions to the Fermi level and the surface potential is presented. Its simple calculation and high accuracy in predicting the surface potential and current-voltage characteristics make the model ideal for circuit simulation applications. This surface-potential-based compact model accounts for the self-heating effect by considering the temperature-dependent free-carrier mobility. The model is verified against numerical results and measured data under a wide range of bias conditions. |
| Sponsorship | IEEE Electron Devices Society |
| Starting Page | 108 |
| Ending Page | 110 |
| Page Count | 3 |
| File Size | 839361 |
| File Format | |
| ISSN | 07413106 |
| Volume Number | 36 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-01-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | HEMTs MODFETs Gallium nitride Aluminum gallium nitride Mathematical model Numerical models Analytical models AlGaN/GaN high-electron mobility transistor (HEMT) drain current compact model self-heating effect |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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