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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Shrivastava, M. Kulshrestha, N. Gossner, H. |
| Copyright Year | 2001 |
| Abstract | Electrostatic discharge (ESD) investigations on the multiwalled carbon nanotubes (MWCNTs) are performed for the first time. A novel ESD failure mechanism of subsequent shell burning has been discovered. By using nanosecond pulse measurements, a new insight into metal-to-carbon nanotube (CNT) contact behavior could be achieved. Clear signature of two very different conduction mechanisms and related failure types at high current injection has been found. By determining the time to failure, an Arrhenius-like relation was extracted, which was explained by the oxidation of CNT shells. Finally, an extraordinary ESD failure current density of MWCNT of 1.2 ×109 A/cm2 could be shown. |
| Sponsorship | IEEE Electron Devices Society IEEE Reliability Society |
| Starting Page | 555 |
| Ending Page | 563 |
| Page Count | 9 |
| File Size | 1445378 |
| File Format | |
| ISSN | 15304388 |
| Volume Number | 14 |
| Issue Number | 1 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-01-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electron tubes Resistance Stress Electrostatic discharges Transient analysis Metals Materials reliability quantum conductance Arrhenius behavior and graphene carbon nanotubes CNT electrostatic discharge (ESD) high field transport multiwalled carbon nanotubes (MWCNT) pulsed technique |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Safety, Risk, Reliability and Quality Electrical and Electronic Engineering |
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