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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Subramani, S. Devarajan, M. |
| Copyright Year | 2001 |
| Abstract | An AlN thin film was fabricated and used as a thermal interface material (TIM) for a high-power light-emitting diode (LED) application. The AlN thin film was stacked with an Al thin film on Al substrates and used as a heat sink. The thermal behavior of a 3-W green LED mounted on the AlN and AlN/Al stack thin-film-coated substrates was tested using a dual interface method. A low value in junction temperature (TJ) of the LED was observed with an AlN/Al stack used as the interface. The observed total thermal resistance (Rth-tot) was low for the AlN/Al-stack-coated Al substrates compared to the bare and thermal-paste-applied Al substrates. The interface thermal resistance (Rth-b-hs) was influenced by the driving currents and observed a low value with the AlN-based coatings. Improved luminosity was observed from the LED with the AlN/Al stack as the TIM. The observed correlated color temperature (CCT) was low for the AlN/Al stack at all driving currents. No significant change was observed in the color rendering index (CRI) and peak wavelength (λpeak). |
| Sponsorship | IEEE Electron Devices Society IEEE Reliability Society |
| Starting Page | 30 |
| Ending Page | 34 |
| Page Count | 5 |
| File Size | 795784 |
| File Format | |
| ISSN | 15304388 |
| Volume Number | 14 |
| Issue Number | 1 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-01-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | III-V semiconductor materials Substrates Light emitting diodes Annealing Current measurement Thermal resistance thermal properties AlN LED optical properties thin film stack thermal interface material |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Safety, Risk, Reliability and Quality Electrical and Electronic Engineering |
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