NDLI: Degradation Mechanisms of High-Power LEDs for Lighting Applications: An Overview

Content Provider	IEEE Xplore Digital Library
Author	Meneghini, M. Dal Lago, M. Trivellin, N. Meneghesso, G. Zanoni, E.
Copyright Year	1972
Abstract	This paper reports on the degradation mechanisms that limit the reliability of high-power light-emitting diodes (LEDs) for lighting applications. The study is based on the experimental characterization of state-of-the-art LEDs fabricated by leading manufacturers. We demonstrate that, despite high potential reliability, high-power LEDs may suffer from a number of degradation mechanisms that affect the stability of the blue semiconductor LED chip and of the phosphor layer used for the generation of white light. More specifically, we describe the following relevant mechanisms: 1) the optical degradation of LEDs, due to an increase in the nonradiative recombination rate, which can be correlated to modifications in the forward-bias current-voltage characteristics; 2) the variation in forward voltage, due to the increase in series resistance; 3) the optical degradation of phosphor layers used for blue-to-white light conversion; and 4) the failure of LEDs submitted to “hot plugging,” which is the direct connection of an LED chain to an energized power supply, due to the generation of high current spikes. Results provide an overview on the failure mechanisms that limit the reliability of state-of-the-art LEDs and on the role of current and temperature in determining the failure of the devices.
Sponsorship	IEEE Industry Applications Society
Starting Page	78
Ending Page	85
Page Count	8
File Size	1606651
File Format	PDF
ISSN	00939994
Volume Number	50
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Light emitting diodes Degradation Phosphors Stress Temperature measurement Current measurement Lighting reliability light-emitting diode (LED) lighting
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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