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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Azgin, K. Akin, T. Valdevit, L. |
| Copyright Year | 1992 |
| Abstract | This paper presents a resonant double-ended tuning fork (DETF) force sensor with an experimentally demonstrated resolution of 7 nN and a compressive load range of 0.08 N, exceeding a dynamic range of 140 dB (100 parts per billion). The resonator has a scale factor of 216 kHz/N, a Q -factor exceeding 60 000 at 3-mtorr ambient pressure, and a zero-load resonant frequency of 47.6 kHz. The resonator is kept at resonance via a phase-locked loop composed of discrete elements. The sensor is implemented with a silicon-on-glass process with a 100-μm -thick <;111>; silicon structural layer. The sensor and the complete readout circuit are fully embedded in a compact 65 mm × 52 mm printed circuit board (PCB). The out-of-plane parasitic modes of the DETF are also investigated with finite-element simulations and laser Doppler vibrometry experiments, and are verified to be outside of the device working range. The PCB is mounted on a microstage and coupled with an off-the-shelf displacement actuator to realize an economical, versatile, and robust micromechanical test frame with unprecedented combination of force and displacement resolution and range. |
| Sponsorship | IEEE Electron Devices Society American Society of Mechanical Engineering (ASME) |
| Starting Page | 1519 |
| Ending Page | 1529 |
| Page Count | 11 |
| File Size | 2073652 |
| File Format | |
| ISSN | 10577157 |
| Volume Number | 21 |
| Issue Number | 6 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-12-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Resonant frequency Force sensors Phase locked loops Vibrations Loading resonant sensors Double-ended tuning fork (DETF) experimental mechanics mechanical test frames microelectromechanical systems (MEMS) micromechanics nanomechanics phase-locked loop (PLL) |
| Content Type | Text |
| Resource Type | Article |
| Subject | Mechanical Engineering Electrical and Electronic Engineering |
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