NDLI: Analysis of Dynamic Range, Linearity, and Noise of a Pulse-Frequency Modulation Pixel

Content Provider	IEEE Xplore Digital Library
Author	Tsung-Hsun Tsai Hornsey, R.
Copyright Year	1963
Abstract	A complete pulse-frequency modulation (PFM) pixel design analysis and noise measurement for CMOS image sensor applications are presented. This work investigates the design parameters such as dynamic range (DR), signal linearity, and comparator characteristics. The design strategies for wide DR imaging are addressed in detail, and signal linearity is analyzed by considering the analog circuit parameters. The temporal noise is also measured to understand the design tradeoffs of the PFM pixels. The analysis is executed by performing HSPICE simulation and practical pixel measurements. The technology used by the measured pixel is a 0.18-μm one-poly six-metal CMOS process. According to the results, a PFM pixel using the submicrometer CMOS process has a DR of 130-160 dB, and the cost of reaching a higher signal linearity or lower noise floor is the loss of frame rate. In addition, the bandwidth of the comparator can be extended to improve sensor linearity.
Sponsorship	IEEE Electron Devices Society
Starting Page	2675
Ending Page	2681
Page Count	7
File Size	825730
File Format	PDF
ISSN	00189383
Volume Number	59
Issue Number	10
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-10-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Transistors Linearity Photodiodes Imaging Lighting Noise Dynamic range temporal noise CMOS image sensor dynamic range (DR) pixel pulse-frequency modulation (PFM) signal linearity
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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