NDLI: DSP-Driven Self-Tuning of RF Circuits for Process-Induced Performance Variability

Content Provider	IEEE Xplore Digital Library
Author	Donghoon Han Byung Sung Kim Chatterjee, A.
Copyright Year	1993
Abstract	In the deep-submicrometer design regime, RF circuits are expected to be increasingly susceptible to process variations, and thereby suffer from significant loss of parametric yield. To address this problem, a postmanufacture self-tuning technique that aims to compensate for multiparameter variations is presented. The proposed method incorporates a ¿response feature¿ detector and ¿hardware tuning knobs,¿ designed into the RF circuit. The RF device test response to a specially crafted diagnostic test stimulus is logged via the built-in detector and embedded analog-to-digital converter. Analysis and prediction of the optimal tuning knob control values for performance compensation is performed using software running on the baseband DSP processor. As a result, the RF circuit performance can be diagnosed and tuned with minimal assistance from external test equipment. Multiple RF performance parameters can be adjusted simultaneously under tuning knob control. The proposed concepts are illustrated for an RF low-noise amplifier (LNA) design and can be applied to other RF circuits as well. A simulation case study and hardware measurements on a fabricated 1.9-GHz LNAs show significant parametric yield enhancement (up to 58%) across the critical RF performance specifications of interest.
Sponsorship	IEEE Computer Society Association for Computing Machinery (ACM)/SIGDA IEEE Computer Society Technical Committee on Design Automation
Starting Page	305
Ending Page	314
Page Count	10
File Size	867533
File Format	PDF
ISSN	10638210
Volume Number	18
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Radio frequency Circuit optimization Detectors Circuit testing Tuning Computer vision Analog-digital conversion Performance analysis Optimal control Software performance self-tuning Parametric yield process variability RF circuits
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Software Hardware and Architecture

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