NDLI: The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis

Content Provider	IEEE Xplore Digital Library
Author	Wenping Wang Shengqi Yang Bhardwaj, S. Vrudhula, S. Liu, F. Yu Cao
Copyright Year	1993
Abstract	Negative-bias-temperature instability (NBTI) has become the primary limiting factor of circuit life time. In this paper, we develop a hierarchical framework for analyzing the impact of NBTI on the performance of logic circuits under various operation conditions, such as the supply voltage, temperature, and node switching activity. Given a circuit topology and input switching activity, we propose an efficient method to predict the degradation of circuit speed over a long period of time. The effectiveness of our method is comprehensively demonstrated with the International Symposium on Circuits and Systems (ISCAS) benchmarks and a 65-nm industrial design. Furthermore, we extract the following key design insights for reliable circuit design under NBTI effect, including: 1) During dynamic operation, NBTI-induced degradation is relatively insensitive to supply voltage, but strongly dependent on temperature; 2) There is an optimum supply voltage that leads to the minimum of circuit performance degradation; circuit degradation rate actually goes up if supply voltage is lower than the optimum value; 3) Circuit performance degradation due to NBTI is highly sensitive to input vectors. The difference in delay degradation is up to 5× for various static and dynamic operations. Finally, we examine the interaction between NBTI effect, and process and design uncertainty in realistic conditions.
Sponsorship	IEEE Computer Society Association for Computing Machinery (ACM)/SIGDA IEEE Computer Society Technical Committee on Design Automation
Starting Page	173
Ending Page	183
Page Count	11
File Size	1236363
File Format	PDF
ISSN	10638210
Volume Number	18
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Niobium compounds Titanium compounds Combinational circuits Analytical models Circuit simulation Degradation Voltage Switching circuits Circuit optimization Performance analysis temperature Duty cycle input pattern negative bias temperature instability (NBTI) performance degradation speed supply voltage
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Software Hardware and Architecture

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