NDLI: Dynamic Testing of A/D Converters Using the Coherence Function

Content Provider	IEEE Xplore Digital Library
Author	Richards, T.C.
Copyright Year	1963
Abstract	The problem of characterizing an A/D converter is important to manufacturers and end users. The measured characteristics provide the means to compare devices and make design choices. This paper presents a procedure for testing a pair of A/D converters that sample the same analog signal. Since both A/D converters are measuring the same signal, the portion of the measured signals that is incoherent provides an estimate of the total noise of the two devices, from which the A/D converter effective number of bits and signal-to-noise ratio can be calculated. The removal of the coherent signal requires the calculation of the coherence function, which is computed from auto- and cross-spectral densities estimated by the Welch periodogram method. Examples of the procedure are provided for various input signals, input levels, sampling rates, and (simulated) interchannel delays. The measurement examples show that for white-noise inputs, the technique is independent of input-signal level, spectral data window, and sampling rate, provided the inputs are simultaneously sampled. With sine-wave inputs, the technique can be compared to the signal-to-noise and distortion ratio test, and it is shown that coherent removal eliminates the need for an ultrapure sine-wave source. The use of data windows is shown to be detrimental, since sidelobe energy is suppressed causing loss of coherence. The technique simplifies the setup and programming requirements for A/D converter testing because it can be applied using any input signal and is based on widely accepted processing techniques. End users and manufacturers alike should have little difficulty obtaining the programming tools needed to perform the analysis
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	2265
Ending Page	2274
Page Count	10
File Size	760374
File Format	PDF
ISSN	00189456
Volume Number	55
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing Manufacturing Noise measurement Signal to noise ratio Sampling methods Computational modeling Delay Distortion measurement Signal processing Performance analysis spectrum Analog-to-digital (A/D) converter A/D converter characteristics bit noise coherence coherent removal effective number of bits (ENOB) frequency domain cancellation
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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