NDLI: Interaction of Rectangular Open-Ended Waveguides With Surface Tilted Long Cracks in Metals

Content Provider	IEEE Xplore Digital Library
Author	Mazlumi, F. Sadeghi, S.H.H. Moini, R.
Copyright Year	1963
Abstract	This paper presents a modeling technique for output-signal prediction of a waveguide probe when scanning a tilted long crack. The modeling technique establishes a cavity by placing a hypothetical conductive plane within the waveguide at some distance away from the probe-crack mouth. The position of the plane is iteratively changed until the appropriate resonance frequency of the cavity equals the operating frequency. In this case, the plane lies at one of the dominant-mode standing-wave nulls inside the waveguide from which the reflection coefficient, and hence, the probe output signal are determined. The main feature of the model is its ability to solve a three-dimensional problem in a two-dimensional framework, thus reducing the degree of complexity and computation time. Several simulation results are presented to evaluate the accuracy of the model at two operating frequencies in the X and K bands. The results are compared with the experimental results and those obtained using a commercial finite-element code, demonstrating the accuracy of the modeling technique
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	2191
Ending Page	2197
Page Count	7
File Size	259388
File Format	PDF
ISSN	00189456
Volume Number	55
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Rectangular waveguides Surface waves Surface cracks Probes Planar waveguides Predictive models Mouth Resonance Resonant frequency Reflection waveguide Metal microwave nondestructive testing (MNDT) tilted crack
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

A fast circuit model for interaction of open-ended rectangular waveguide probes with surface long cracks in metals

Interaction of an Open-Ended Rectangular Waveguide Probe With an Arbitrary-Shape Surface Crack in a Lossy Conductor

Depth Evaluation of Shallow Surface Cracks in Metals Using Rectangular Waveguides at Millimeter-Wave Frequencies

Innovative Near-Field Microwave Nondestructive Testing of Corroded Metallic Structures Utilizing Open-Ended Rectangular Waveguide Probes

Output Signal Prediction of an Open-Ended Coaxial Probe When Scanning Arbitrary-Shape Surface Cracks in Metals

Microwave Dielectric-Loaded Rectangular Waveguide Resonator for Depth Evaluation of Shallow Flaws in Metals

Modeling of surface hairline-crack detection in metals under coatings using an open-ended rectangular waveguide

Near-Field Millimeter-Wave Imaging of Exposed and Covered Fatigue Cracks

Fast circuit model for interaction of open-ended rectangular waveguide probes with arbitrary-shape surface cracks in metals

Interaction of Rectangular Open-Ended Waveguides With Surface Tilted Long Cracks in Metals

Similar Documents

A fast circuit model for interaction of open-ended rectangular waveguide probes with surface long cracks in metals

Interaction of an Open-Ended Rectangular Waveguide Probe With an Arbitrary-Shape Surface Crack in a Lossy Conductor

Depth Evaluation of Shallow Surface Cracks in Metals Using Rectangular Waveguides at Millimeter-Wave Frequencies

Innovative Near-Field Microwave Nondestructive Testing of Corroded Metallic Structures Utilizing Open-Ended Rectangular Waveguide Probes

Output Signal Prediction of an Open-Ended Coaxial Probe When Scanning Arbitrary-Shape Surface Cracks in Metals

Microwave Dielectric-Loaded Rectangular Waveguide Resonator for Depth Evaluation of Shallow Flaws in Metals

Modeling of surface hairline-crack detection in metals under coatings using an open-ended rectangular waveguide

Near-Field Millimeter-Wave Imaging of Exposed and Covered Fatigue Cracks

Fast circuit model for interaction of open-ended rectangular waveguide probes with arbitrary-shape surface cracks in metals

Interaction of Rectangular Open-Ended Waveguides With Surface Tilted Long Cracks in Metals