NDLI: Comparison on the Sensitivity of Fiber-Optic SONET OC-48 PIN-TIAs Measured by Using Synchronous Modulation Intermixing Technique and Bit Error Rate Tester

Content Provider	IEEE Xplore Digital Library
Author	Yu-Sheng Liao Gong-Ru Lin
Copyright Year	1963
Abstract	A novel synchronous modulation and intermixing (SMIM) technique is presented to measure the sensitivity and evaluate the bit error rate (BER) of p-i-n photodiode receivers with transimpedance amplifiers (PIN-TIAs) without using any BER tester (BERT). When using the SMIM technique, the premier receiving measurement performance from the data rates of the synchronous optical network OC-3 to OC-48 was demonstrated. For general TO-46 packaged PIN-TIAs, a minimum intermixed voltage of 12.5 mV obtained by the SMIM method is equivalent to a sensitivity of -31 dBm at a requested BER of <10^-10 determined by BERT. The relationship between the monitoring voltage and the BER of the optical pattern received by the PIN-TIA and limited amplifier is estimated. The error of the measured voltage is 0.28 mV, which corresponds to the error sensitivity of 0.09 dB. This would show the accuracy of the simplified and low-cost SMIM technique for in situ diagnostics on a mass-production line
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	2172
Ending Page	2175
Page Count	4
File Size	295911
File Format	PDF
ISSN	00189456
Volume Number	55
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Optical fiber testing SONET Bit error rate Voltage Optical receivers Optical amplifiers PIN photodiodes Packaging Monitoring Stimulated emission synchronous optical network (SONET) OC-48 Bit error rate (BER) intermixing p-i-n photodiode receiver with transimpedance amplifier (PIN-TIA) sensitivity synchronous modulation
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

3 Gbit/s optical receiver IC with high sensitivity and large integrated pin photodiode

A CMOS Tunable Transimpedance Amplifier

A Si BiCMOS transimpedance amplifier for 10-Gb/s SONET receiver

Optical Receiver With Widely Tunable Sensitivity in BiCMOS Technology

A Transimpedance Amplifier With a Tunable Bandwidth in 0.18-$mu{hbox{m}}$ CMOS

A 3-GHz 32-dB CMOS limiting amplifier for SONET OC-48 receivers

Record −22.5-dBm Sensitivity SOA-PIN-TIA Photoreceiver Module for 40-Gb/s Applications

Low-Power BiCMOS Optical Receiver With Voltage-Controlled Transimpedance

A 5-Gb/s Radiation-Tolerant CMOS Optical Receiver

Comparison on the Sensitivity of Fiber-Optic SONET OC-48 PIN-TIAs Measured by Using Synchronous Modulation Intermixing Technique and Bit Error Rate Tester

Similar Documents

3 Gbit/s optical receiver IC with high sensitivity and large integrated pin photodiode

A CMOS Tunable Transimpedance Amplifier

A Si BiCMOS transimpedance amplifier for 10-Gb/s SONET receiver

Optical Receiver With Widely Tunable Sensitivity in BiCMOS Technology

A Transimpedance Amplifier With a Tunable Bandwidth in 0.18-$mu{hbox{m}}$ CMOS

A 3-GHz 32-dB CMOS limiting amplifier for SONET OC-48 receivers

Record −22.5-dBm Sensitivity SOA-PIN-TIA Photoreceiver Module for 40-Gb/s Applications

Low-Power BiCMOS Optical Receiver With Voltage-Controlled Transimpedance

A 5-Gb/s Radiation-Tolerant CMOS Optical Receiver

Comparison on the Sensitivity of Fiber-Optic SONET OC-48 PIN-TIAs Measured by Using Synchronous Modulation Intermixing Technique and Bit Error Rate Tester