NDLI: Minimizing production test time to detect faults in analog circuits

Content Provider	IEEE Xplore Digital Library
Author	Milor, L. Sangiovanni-Vincentelli, A.L.
Copyright Year	1982
Abstract	Analog testing is a difficult task without a clearcut methodology. Analog circuits are tested for satisfying their specifications, not for faults. Given the high cost of testing analog specifications, it is proposed that tests for analog circuits should be designed to detect faults. Therefore analog fault modeling is discussed. Based on an analysis of the types of tests needed for different types of faults, algorithms for fault-driven test set selection are presented. A major reduction in testing time should come from reducing the number of specification tests that need to be performed. Hence algorithms are presented for minimizing specification testing time. After specification testing time is minimized, the resulting test sets are supplemented with some simple, possibly non-specification, tests to achieve 100% fault coverage. Examples indicate that fault-driven test set development can lead to drastic reductions in production testing time.<>
Sponsorship	IEEE Council on Electronic Design Automation IEEE Circuits and Systems Society
Starting Page	796
Ending Page	813
Page Count	18
File Size	1919953
File Format	PDF
ISSN	02780070
Volume Number	13
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Production Electrical fault detection Fault detection Circuit faults Analog circuits Costs Fabrication Performance evaluation Manufacturing
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Electrical and Electronic Engineering Software

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