NDLI: DFT for digital detection of analog parametric faults in SC filters

Content Provider	IEEE Xplore Digital Library
Author	Vinnakota, B. Harjani, R.
Copyright Year	1982
Abstract	Parametric faults are a significant cause of incorrect operation in analog circuits. Many design for test techniques for analog circuits are ineffective at detecting multiple parametric faults because either their accuracy is poor, or the circuit is not tested in the configuration in which it is used. We present a design for test (DFT) scheme that offers the accuracy needed to test high-quality circuits. The DFT scheme is based on a circuit that digitally measures the ratio of a pair of capacitors. The circuit is used to characterize the transfer function of a switched capacitor circuit, which is usually determined by capacitor ratios. In our DFT scheme, capacitor ratios can be measured to within 0.01% accuracy and filter parameters can be shown to be satisfied to within 0.1% accuracy. With this characterization process, a filter can be directly shown to satisfy all specifications that depend on capacitor ratios. We believe the accuracy of our approach is at least an order of magnitude greater than that offered by any other DFT scheme reported in the literature.
Sponsorship	IEEE Council on Electronic Design Automation IEEE Circuits and Systems Society
Starting Page	789
Ending Page	798
Page Count	10
File Size	152522
File Format	PDF
ISSN	02780070
Volume Number	19
Issue Number	7
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-07-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault detection Digital filters Circuit faults Circuit testing Design for testability Switched capacitor circuits Electrical fault detection Analog circuits Costs Circuit simulation
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Electrical and Electronic Engineering Software

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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